• June 12, 2019

Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.

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If this is not practical, apply the estimation procedure to as much of the specimen as is reasonable, but recognize that, by not sampling w1181 of the specimen area, some undened bias may be introduced into the estimate. The regions occupied by a distinct grain size are manually outlined on a photomicrograph or transparent overlay. Use the “Duplex” button to start the programs designed to calculate duplex grain sizes.

An example of that bimodal ferrite grain size is shown in Fig. Further suppose that measurements indicate an average depth of that surface layer of 1. The Measuring and Referee Procedures are more difficult to apply, but offer greater accuracy.

However, the test methods described here for area fraction estimation may be of use in describing duplex grain structures. Link to Active This link will always route to the current Active version of the standard. The area fraction occupied by the coarse grain was calculated from the corresponding values, as A tube whose wall thickness is small compared to its outside diameter may be treated as equivalent to a 1e181 of rectangular cross-section, in that a surface layer of a given depth at 5 the outside f1181 covers essentially the same area as a layer of the same depth at the inside diameter.

An example photomicrograph of the banding condition appears in Fig. An example photomicrograph of the ALA condition appears in Fig. It is the responsibility of the user of this standard to consult appropriate safety and health practices and determine the applicability of regulatory limitations prior to its use.


ASTM E – 02() Standard Test Methods for Characterizing Duplex Grain Sizes

To characterize these patterns accurately, the entire cross-section of the specimen or product must be evaluated. This procedure can be carried out much more efficiently through the use of an automated image analysis system with an electronic pencil or cursor, or through the use of a semi-automated image analysis system with astmm digitizing tablet and electronic pencil or cursor.

For the coarse grain size, the number of intercepts totaled 13, and the intercept length totaled These different applications are described in 8. One, the Direct Measurement Procedure see 8.

For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen. Examples of topological duplex grain sizes include: A further example appears in Fig. An additional button, “Duplex”, is found at the bottom of the control panel.

Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods. Signicance and Use 5. Compare such gures with eyepiece or projected images from a microscope, or with photomicrographs.

Etch specimens so that all grain boundaries are distinct and easily visible.

The chart shows different area percentages of light grains among dark grains. Selecting only part of the specimen surface may inadvertently eliminate areas that have high or low concentrations of one of the grain sizes, thus biasing the estimate. Use one of the procedures from 8.

Standard test methods for characterizing duplex grain sizes – CERN Document Server

The test grid consists of a square network of grid lines, with a recommended interline spacing of 5 mm. Any of the Intercept Procedures of E may be used, within the regions of distinct grain size. The percent of the total intercept length represented by the intercept length in each class interval was then calculated by dividing each value in the seventh column by the total intercept length In this example, the results would be reported as: For the coarse grain, the corresponding intercept length wstm Precision and Bias 9.


Accordingly, the longitudinal orientation is recommended, with one exception. Click here to display results spreadsheet.

The values from this calculation were entered in the seventh column of Table X2. An example of such a histogram is shown in Fig. Each photomicrograph is accompanied by the corresponding reporting format for that type of duplex grain size.

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These items are briey described below, under the headings of the specic procedures to which they apply. Calibration is set by clicking on the “Calibrate” choice in the Dialog Menu Bar. This value was then entered in the eighth column. The test grid consists of a series of ne, parallel lines, with an interline spacing of 5 mm. Referenced Documents purchase xstm The documents listed below are referenced within the subject standard but are not provided as part of the standard.

If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well.